RADIATION INDUCED PEAKING EFFECT IN OPEN GEOMETRY P-CHANNEL MOSFETS

被引:4
作者
NEWMAN, PA
WANNEMAC.HE
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D O I
10.1109/TNS.1967.4324810
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
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页码:299 / &
相关论文
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[1]   A MODEL FOR RADIATION DAMAGE IN METAL-OXIDE-SEMICONDUCTOR STRUCTURES [J].
GROVE, AS ;
SNOW, EH .
PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1966, 54 (06) :894-+
[2]  
LACOUR, 1967, CNESNR12863 CONTR
[3]  
STANLEY AG, 1967, IEEE T ELECTRON DEVI, VED14, P134