DETECTION OF HIGH MASS CLUSTER IONS SPUTTERED FROM BI SURFACES

被引：16

作者：

SHEPARD, A

HEWITT, RW

SLUSSER, GJ

BAITINGER, WE

COOKS, RG

WINOGRAD, N

DELGASS, WN

VARON, A

DEVANT, G

机构：

[1] PURDUE UNIV,DEPT CHEM,W LAFAYETTE,IN 47907

[2] PURDUE UNIV,SCH CHEM ENGN,W LAFAYETTE,IN 47907

[3] RIBER INSTR ULTRA VIDE,F-92503 RUEIL,FRANCE

来源：

CHEMICAL PHYSICS LETTERS | 1976年 / 44卷 / 02期

关键词：

D O I：

10.1016/0009-2614(76)80533-7

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

收藏

页码：371 / 373

页数：3

相关论文

共 6 条

[1] ADSORPTION AND SURFACE REACTIVITY OF METALS BY SECONDARY ION MASS-SPECTROMETRY .1. ADSORPTION OF CARBON-MONOXIDE ON NICKEL AND COPPER
BARBER, M
VICKERMAN, JC
WOLSTENHOLME, J
[J]. JOURNAL OF THE CHEMICAL SOCIETY-FARADAY TRANSACTIONS I, 1976, 72 : 40 - 50
[2] STUDIES OF ADSORPTION AND SURFACE REACTIVITY OF METALS BY SECONDARY ION MASS-SPECTROMETRY .2. ADSORPTION OF ETHYLENE ON NICKEL
BARBER, M
VICKERMAN, JC
WOLSTENHOLME, J
[J]. JOURNAL OF CATALYSIS, 1976, 42 (01) : 48 - 53
[3] DEVELOPMENTS IN SECONDARY ION MASS-SPECTROSCOPY AND APPLICATIONS TO SURFACE STUDIES
BENNINGHOVEN, A
[J]. SURFACE SCIENCE, 1975, 53 (DEC) : 596 - 625
[4] ANGULAR AND ENERGY DISTRIBUTIONS IN SECONDARY IONIC EMISSIONS .3. ANGULAR DISTRIBUTION AND IONIC YIELD
HENNEQUIN, JF
[J]. JOURNAL DE PHYSIQUE, 1968, 29 (10): : 957 - +
[5] SHEPARD A, TO BE PUBLISHED
[6] STANDENMAIER G, 1972, RAD EFFECTS, V13, P87