DEPENDENCE OF 1/F NOISE ON DEFECTS INDUCED IN COPPER-FILMS BY ELECTRON-IRRADIATION

被引：80

作者：

PELZ, J ^{[1
]}

CLARKE, J ^{[1
]}

机构：

[1] UNIV CALIF BERKELEY LAWRENCE BERKELEY LAB,DIV MAT & MOLEC RES,BERKELEY,CA 94720

来源：

PHYSICAL REVIEW LETTERS | 1985年 / 55卷 / 07期

关键词：

D O I：

10.1103/PhysRevLett.55.738

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：738 / 741

页数：4

共 16 条

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[8] THE INTERPRETATION OF X-RAY-SCATTERING AND ELECTRON-MICROSCOPY OBSERVATIONS ON ELECTRON-IRRADIATED COPPER [J].

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