LEAST-SQUARES REFINEMENT OF MOLECULAR STRUCTURES FROM GASEOUS ELECTRON-DIFFRACTION SECTOR-MICROPHOTOMETER 2NTENSITY DATA .I. METHOD

被引：251

作者：

HEDBERG, K

IWASAKI, M

机构：

来源：

ACTA CRYSTALLOGRAPHICA | 1964年 / 17卷 / 05期

关键词：

D O I：

10.1107/S0365110X64001244

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：529 / &

共 7 条

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[J]. JOURNAL OF CHEMICAL PHYSICS, 1957, 27 (06) : 1311 - 1317
[3] RAPID PROCEDURE FOR RIGOROUS ANALYSIS OF ELECTRON DIFFRACTION DATA
BONHAM, RA
BARTELL, LS
[J]. JOURNAL OF CHEMICAL PHYSICS, 1959, 31 (03) : 702 - 708
[4] THE ACCURACY OF INTER-ATOMIC DISTANCES OBTAINED IN ELECTRON DIFFRACTION INVESTIGATIONS OF MOLECULAR STRUCTURES
CRUICKSHANK, DWJ
VIERVOLL, H
[J]. ACTA CHEMICA SCANDINAVICA, 1949, 3 (05): : 560 - 568
[5] HAMILTON WA, 1955, THESIS CALIFORNIA I
[6] HAMILTON WD, UNPUBLISHED
[7] Hughes E. W., 1941, J AM CHEM SOC, V63, P1737