STRUCTURAL CHARACTERIZATION OF SELF-ASSEMBLED MULTILAYERS BY FTIR

被引：40

作者：

BENT, SF ^{[1
]}

SCHILLING, ML ^{[1
]}

WILSON, WL ^{[1
]}

KATZ, HE ^{[1
]}

HARRIS, AL ^{[1
]}

机构：

[1] AT&T BELL LABS,600 MT AVE,MURRAY HILL,NJ 07974

来源：

CHEMISTRY OF MATERIALS | 1994年 / 6卷 / 02期

关键词：

D O I：

10.1021/cm00038a006

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

We have used attenuated total reflection infrared spectroscopy (ATR-IR) to probe the structural order in zirconium-phosphonate self-assembled multilayers. Very well-ordered alkylsiloxane anchor layers can be prepared on silicon substrates after suitable etching. However, the IR spectra indicate that zirconium-organophosphonate multilayers deposited onto the anchor layer are disordered. The disorder correlates with introduction of zirconium and appears to be a result of the poor match of the hydrocarbon lattice with the stronger inorganic Zr-phosphonate lattice. There is no additional degradation in packing order with the deposition of multiple layers. Ramiflcations for possible device application are discussed.

引用

页码：122 / 126

页数：5

共 41 条

[1] SPONTANEOUSLY ORGANIZED MOLECULAR ASSEMBLIES .2. QUANTITATIVE INFRARED SPECTROSCOPIC DETERMINATION OF EQUILIBRIUM STRUCTURES OF SOLUTION-ADSORBED NORMAL-ALKANOIC ACIDS ON AN OXIDIZED ALUMINUM SURFACE [J].