ELECTRON-SPIN-RESONANCE STUDIES OF DAMAGE PROCESSES IN X-IRRADIATED HIGH-PURITY A-SIO2-OH AND CHARACTERIZATION OF THE FORMYL RADICAL DEFECT

被引：94

作者：

GRISCOM, DL

STAPELBROEK, M

FRIEBELE, EJ

机构：

来源：

JOURNAL OF CHEMICAL PHYSICS | 1983年 / 78卷 / 04期

关键词：

D O I：

10.1063/1.444962

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：1638 / 1651

页数：14

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