SURFACE QUANTITATIVE-ANALYSIS OF CR-O SYSTEMS BY XPS

[1] ALLEN GC, 1973, J CHEM SOC DALTON, P1675

[2] X-RAY PHOTO-ELECTRON SPECTROSCOPY AND ELECTROCHEMICAL ANALYSIS OF PASSIVATED ELECTROLYTIC TIN PLATE SURFACES [J]. SURFACE TECHNOLOGY, 1982, 15 (03): : 255 - 275

[3] AN XPS AND MOSSBAUER STUDY OF THE ELECTRONIC-PROPERTIES OF ZNCRXGA2-XO4 SPINEL SOLID-SOLUTIONS [J]. SOLID STATE COMMUNICATIONS, 1981, 39 (04) : 581 - 585

[4] BATTISTONI C, UNPUB

[5] USE OF X-RAY PHOTOELECTRON SPECTROSCOPY TO STUDY BONDING IN CR, MN, FE, AND CO COMPOUNDS [J]. JOURNAL OF CHEMICAL PHYSICS, 1972, 57 (02) : 973 - +

[6] ANALYSIS PROFILES OF OXIDE-FILMS ON CHROME STEEL BY AUGER EMISSION AND X-RAY PHOTOELECTRON SPECTROSCOPIES [J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1974, 3 (06) : 435 - 448

[7] SURFACE REDUCTION OF SOME CHROMIUM COMPOUNDS DURING X-RAY PHOTOELECTRON-SPECTROSCOPY [J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1976, 9 (01) : 81 - 84

[8] RELATIVE DIFFERENTIAL SUBSHELL PHOTOIONIZATION CROSS-SECTIONS (MGK-ALPHA) FROM LITHIUM TO URANIUM [J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1978, 14 (05) : 341 - 358

[9] X-RAY PHOTOELECTRON SPECTROSCOPIC STUDIES OF CRO2 AND SOME RELATED CHROMIUM COMPOUNDS [J]. JOURNAL OF SOLID STATE CHEMISTRY, 1976, 17 (04) : 425 - 430

[10] RELATIVE INTENSITIES AND WIDTHS OF X-RAY INDUCED PHOTOELECTRON SIGNALS FROM DIFFERENT SHELLS IN 72 ELEMENTS [J]. FARADAY DISCUSSIONS, 1972, 54 : 269 - 276

[1] ALLEN GC, 1973, J CHEM SOC DALTON, P1675

[2] X-RAY PHOTO-ELECTRON SPECTROSCOPY AND ELECTROCHEMICAL ANALYSIS OF PASSIVATED ELECTROLYTIC TIN PLATE SURFACES [J]. SURFACE TECHNOLOGY, 1982, 15 (03): : 255 - 275

[3] AN XPS AND MOSSBAUER STUDY OF THE ELECTRONIC-PROPERTIES OF ZNCRXGA2-XO4 SPINEL SOLID-SOLUTIONS [J]. SOLID STATE COMMUNICATIONS, 1981, 39 (04) : 581 - 585

[4] BATTISTONI C, UNPUB

[5] USE OF X-RAY PHOTOELECTRON SPECTROSCOPY TO STUDY BONDING IN CR, MN, FE, AND CO COMPOUNDS [J]. JOURNAL OF CHEMICAL PHYSICS, 1972, 57 (02) : 973 - +

[6] ANALYSIS PROFILES OF OXIDE-FILMS ON CHROME STEEL BY AUGER EMISSION AND X-RAY PHOTOELECTRON SPECTROSCOPIES [J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1974, 3 (06) : 435 - 448

[7] SURFACE REDUCTION OF SOME CHROMIUM COMPOUNDS DURING X-RAY PHOTOELECTRON-SPECTROSCOPY [J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1976, 9 (01) : 81 - 84

[8] RELATIVE DIFFERENTIAL SUBSHELL PHOTOIONIZATION CROSS-SECTIONS (MGK-ALPHA) FROM LITHIUM TO URANIUM [J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1978, 14 (05) : 341 - 358

[9] X-RAY PHOTOELECTRON SPECTROSCOPIC STUDIES OF CRO2 AND SOME RELATED CHROMIUM COMPOUNDS [J]. JOURNAL OF SOLID STATE CHEMISTRY, 1976, 17 (04) : 425 - 430

[10] RELATIVE INTENSITIES AND WIDTHS OF X-RAY INDUCED PHOTOELECTRON SIGNALS FROM DIFFERENT SHELLS IN 72 ELEMENTS [J]. FARADAY DISCUSSIONS, 1972, 54 : 269 - 276