INSITU DETERMINATION OF THE OPTICAL-CONSTANTS OF TITANIUM SURFACE-FILMS FORMED IN HIGHER VOLTAGE ANODIZATION

被引：7

作者：

ARSOV, LD

EFREMOVA, AT

机构：

来源：

ELECTROCHIMICA ACTA | 1992年 / 37卷 / 11期

关键词：

ELLIPSOMETRY; TITANIUM OXIDE FILMS; ANODIZATION; OPTICAL CONSTANTS;

D O I：

10.1016/0013-4686(92)87128-M

中图分类号：

O646 [电化学、电解、磁化学];

学科分类号：

081704 ;

摘要：

The optical constants and thickness of anodic oxide films formed on titanium surface, during the polarization, have been determined in 0.5 M H2SO4 by in situ ellipsometric measurements. The anodic titanium films are formed in the voltage region from 0 to 100 V. The possibility of determining the real part film refractive index without direct utilization of the metal substrate refractive index has been shown.

引用

页码：2099 / 2100

页数：2

共 8 条

[1] ANODIC-OXIDATION OF TITANIUM IN SULFURIC SOLUTION - NATURE, THICKNESS AND REFRACTIVE-INDEX OF FILMS [J].