LOCAL PROPERTIES OF PHASE-SEPARATED POLYMER SURFACES BY FORCE MICROSCOPY

被引：19

作者：

MOTOMATSU, M

NIE, HY

MIZUTANI, W

TOKUMOTO, H

机构：

[1] Joint Research Center for Atom Technology (JRCAT), Angstrom Technology Partnership (ATP), National Institute for Interdisciplinary Research (NAIR), Tsukuba, Ibaraki, 305

[2] JRCAT, NAIR, Tsukuba, Ibaraki, 305

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1994年 / 33卷 / 6B期

关键词：

MORPHOLOGY; PHASE SEPARATION; ATOMIC FORCE MICROSCOPY; FORCE MICROSCOPY; COPOLYMER; POLYMER BLEND; PS; PMMA;

D O I：

10.1143/JJAP.33.3775

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Force microscopy techniques such as atomic force microscopy (AFM), friction force microscopy (FFM), and force modulation microscopy (FMM) were applied to polymer blend and copolymer surfaces to observe phase-separated structures and distinguish the individual components. We observed a continuous phase-separated structure of polystyrene (PS)/polyethyleneoxide (PEO) polymer blend, a micro-phase-separated structure of styrene (S)/butadiene (B) S-B-S-B block copolymer, and islands-sea phase-separated structures of PS/polymethylmethacrylate (PMMA) polymer blend and diblock copolymer with AFM. FFM and FMM were applied to PS/PMMA polymer blend and diblock copolymer, and FFM differentiated PS from PMMA.

引用

页码：3775 / 3778

页数：4

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