CHARACTERIZATION OF THE AG/YBA2CU3O7-X CONTACT IN THIN-FILMS

被引：12

作者：

JIA, QX ^{[1
]}

ANDERSON, WA ^{[1
]}

ZHENG, JP ^{[1
]}

ZHU, YZ ^{[1
]}

PATEL, S ^{[1
]}

KWOK, HS ^{[1
]}

SHAW, DT ^{[1
]}

机构：

[1] SUNY BUFFALO,INST SUPERCONDUCT,BUFFALO,NY 14260

来源：

JOURNAL OF APPLIED PHYSICS | 1990年 / 68卷 / 12期

关键词：

D O I：

10.1063/1.346878

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Silver (Ag) contacts to very thin superconducting YBa2Cu3O7-x films were prepared by thermal evaporation. The nature of the Ag/YBa2Cu3O7-x contact during thermal treatment was in situ investigated by a combination of three- and four-terminal resistance measurements. The experimental results suggested that the interaction between Ag and the YBa2Cu3O7-x film began at a temperature of around 370-degrees-C. The contact resistance measurement for different films also demonstrated that the contact property was a strong function of the film quality and surface conditions. The lack of reproducibility in forming a low-resistance contact to very thin YBa2Cu3O7-x films and the high probability of degrading the film quality after thermal treatment of the contact might be due to the excess Ag doping in YBa2Cu3O7-x.Ag island formation, as revealed by scanning electron microscopy after thermal treatment of the contact, is a limitation of Ag for use as a good contact electrode for very thin superconducting films.

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页码：6336 / 6340

页数：5

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