THE IMR ATOM PROBE

被引：38

作者：

HONO, K

HASHIZUME, T

SAKURAI, T

机构：

[1] Institute for Materials Research, Tohoku University, Sendai

来源：

SURFACE SCIENCE | 1992年 / 266卷 / 1-3期

关键词：

D O I：

10.1016/0039-6028(92)91067-L

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

We have constructed a focusing type time-of-light atom-probe field-ion microscope (APFIM). This atom probe has unique features of (1) low-temperature sample cooling capability (18 K) which allows stable He ion image observations of even aluminum alloys and (2) switchable detector system with a channeltron electron multiplier and channelplate electron multiplier, in addition to the standard features as a modern APFIM. This paper describes the details of the IMR atom probe.

引用

页码：506 / 512

页数：7

共 15 条

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