SUBWAVELENGTH RESOLUTION FAR-INFRARED MICROSCOPY

被引：37

作者：

MASSEY, GA

DAVIS, JA

KATNIK, SM

OMON, E

机构：

来源：

APPLIED OPTICS | 1985年 / 24卷 / 10期

关键词：

D O I：

10.1364/AO.24.001498

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

收藏

页码：1498 / 1501

页数：4

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