MONOCHROMATOR VERSUS DECONVOLUTION FOR XPS STUDIES USING A KRATOS ES300 SYSTEM

被引：12

作者：

KOENIG, MF

GRANT, JT

机构：

来源：

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 1985年 / 36卷 / 03期

关键词：

D O I：

10.1016/0368-2048(85)80020-7

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

引用

页码：213 / 225

页数：13

共 14 条

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[3] NEW DEVELOPMENTS IN ESCA-INSTRUMENTATION [J].

FELLNERFELDEGG, H ;

GELIUS, U ;

WANNBERG, B ;

NILSSON, AG ;

BASILIER, E ;

SIEGBAHN, K .

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1974, 5 (NOV-D) :643-689

[4]

HERD QC, 1977, KRATOS TECHNICAL INF

[5] DECONVOLUTION IN X-RAY PHOTOELECTRON-SPECTROSCOPY [J].

KOENIG, MF ;

GRANT, JT .

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1984, 33 (01) :9-22

[6]

KOENIG MF, SURF INTERFACE ANAL

[7] CORRECTION OF DISTORTIONS IN SPECTRAL-LINE PROFILES - APPLICATIONS TO ELECTRON SPECTROSCOPIES [J].

MADDEN, HH ;

HOUSTON, JE .

JOURNAL OF APPLIED PHYSICS, 1976, 47 (07) :3071-3082

[8]

Seah M. P., 1980, Surface and Interface Analysis, V2, P222, DOI 10.1002/sia.740020607

[9]

SHAFFNER TJ, 1983, SCANNING ELECTRON MI, V3, P1107

[10]

WAGNER C, COMMUNICATION

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