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VIRTUAL PHASE CHARGE COUPLED DEVICE IMAGER OPERATED IN FRONTSIDE ELECTRON-BOMBARDED MODE
被引:4
作者
:
EVERETT, P
论文数:
0
引用数:
0
h-index:
0
机构:
PRINCETON UNIV, PRINCETON, NJ 08544 USA
EVERETT, P
HYNECEK, J
论文数:
0
引用数:
0
h-index:
0
机构:
PRINCETON UNIV, PRINCETON, NJ 08544 USA
HYNECEK, J
ZUCCHINO, P
论文数:
0
引用数:
0
h-index:
0
机构:
PRINCETON UNIV, PRINCETON, NJ 08544 USA
ZUCCHINO, P
LOWRANCE, J
论文数:
0
引用数:
0
h-index:
0
机构:
PRINCETON UNIV, PRINCETON, NJ 08544 USA
LOWRANCE, J
机构
:
[1]
PRINCETON UNIV, PRINCETON, NJ 08544 USA
[2]
TEXAS INSTRUMENTS INC, DALLAS, TX 75265 USA
来源
:
OPTICAL ENGINEERING
|
1985年
/ 24卷
/ 02期
关键词
:
D O I
:
10.1117/12.7973485
中图分类号
:
O43 [光学];
学科分类号
:
070207 ;
0803 ;
摘要
:
5
引用
收藏
页码:360 / 362
页数:3
相关论文
共 5 条
[1]
Bethe H, 1930, ANN PHYS-BERLIN, V5, P325
[2]
THEORETICAL AND EXPERIMENTAL GAIN OF ELECTRON-EXCITED SILICON TARGETS
[J].
GULDBERG, J
论文数:
0
引用数:
0
h-index:
0
GULDBERG, J
;
SCHRODER, DK
论文数:
0
引用数:
0
h-index:
0
SCHRODER, DK
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1971,
ED18
(11)
:1029
-&
[3]
VIRTUAL PHASE TECHNOLOGY - A NEW APPROACH TO FABRICATION OF LARGE-AREA CCDS
[J].
HYNECEK, J
论文数:
0
引用数:
0
h-index:
0
HYNECEK, J
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1981,
28
(05)
:483
-489
[4]
DETERMINATION OF THE TOTAL X-RAY DOSE IN THE SIO2 LAYER OF BACKSIDE ELECTRON-IRRADIATED ICCD IMAGERS
[J].
KENNEDY, AJ
论文数:
0
引用数:
0
h-index:
0
机构:
Night Vision and Electro-Optics Laboratory, Fort Belvoir
KENNEDY, AJ
.
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1979,
26
(06)
:4885
-4891
[5]
BACKSCATTERING OF KILOVOLT ELECTRONS FROM SOLIDS
[J].
STERNGLASS, EJ
论文数:
0
引用数:
0
h-index:
0
STERNGLASS, EJ
.
PHYSICAL REVIEW,
1954,
95
(02)
:345
-358
←
1
→
共 5 条
[1]
Bethe H, 1930, ANN PHYS-BERLIN, V5, P325
[2]
THEORETICAL AND EXPERIMENTAL GAIN OF ELECTRON-EXCITED SILICON TARGETS
[J].
GULDBERG, J
论文数:
0
引用数:
0
h-index:
0
GULDBERG, J
;
SCHRODER, DK
论文数:
0
引用数:
0
h-index:
0
SCHRODER, DK
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1971,
ED18
(11)
:1029
-&
[3]
VIRTUAL PHASE TECHNOLOGY - A NEW APPROACH TO FABRICATION OF LARGE-AREA CCDS
[J].
HYNECEK, J
论文数:
0
引用数:
0
h-index:
0
HYNECEK, J
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1981,
28
(05)
:483
-489
[4]
DETERMINATION OF THE TOTAL X-RAY DOSE IN THE SIO2 LAYER OF BACKSIDE ELECTRON-IRRADIATED ICCD IMAGERS
[J].
KENNEDY, AJ
论文数:
0
引用数:
0
h-index:
0
机构:
Night Vision and Electro-Optics Laboratory, Fort Belvoir
KENNEDY, AJ
.
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1979,
26
(06)
:4885
-4891
[5]
BACKSCATTERING OF KILOVOLT ELECTRONS FROM SOLIDS
[J].
STERNGLASS, EJ
论文数:
0
引用数:
0
h-index:
0
STERNGLASS, EJ
.
PHYSICAL REVIEW,
1954,
95
(02)
:345
-358
←
1
→