INSTRUMENTAL CONDITIONS OF SECONDARY ION MASS-SPECTROMETRY THAT AFFECT SENSITIVITY FOR OBSERVATION OF VERY HIGH MASSES

被引：23

作者：

ABERTH, W

机构：

[1] Univ of California, San Francisco,, CA, USA, Univ of California, San Francisco, CA, USA

来源：

ANALYTICAL CHEMISTRY | 1986年 / 58卷 / 06期

关键词：

BIOLOGICAL MATERIALS - Spectroscopic Analysis - SPECTROSCOPY - Applications;

D O I：

10.1021/ac00297a055

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

It is demonstrated by comparing the mass spectra of cesium iodide cluster ions obtained under different operating parameters that such factors as acceleration voltage, system pressure, and primary beam energy affect the high-mass signal current to a greater extent than that of the low mass. The measurements imply that consideration should be given to these parameters for more effective analysis of high-mass compounds.

引用

页码：1221 / 1225

页数：5

共 30 条

[1] HIGH MASS ANALYSIS CAPABILITY OF A WIEN SPECTROMETER
ABERTH, W
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[2] SECONDARY ION MASS-SPECTROMETRY WITH CESIUM ION PRIMARY BEAM AND LIQUID TARGET MATRIX FOR ANALYSIS OF BIOORGANIC COMPOUNDS
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ABERTH, W
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ABERTH, W
BURLINGAME, AL
[J]. ANALYTICAL CHEMISTRY, 1984, 56 (14) : 2915 - 2918
[5] ABERTH W, 1985, 10TH P INT MASS SPEC
[6] ABERTH W, 1985, 33RD ANN C MASS SPEC
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[8] MOLECULAR SECONDARY ION MASS-SPECTROMETRY WITH A LIQUID-METAL ION PRIMARY SOURCE
BAROFSKY, DF
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BELL, AE
SWANSON, LW
[J]. ANALYTICAL CHEMISTRY, 1983, 55 (08) : 1318 - 1323
[9] THRESHOLD STUDIES OF SECONDARY-ELECTRON EMISSION INDUCED BY MACRO-ION IMPACT ON SOLID-SURFACES
BEUHLER, RJ
FRIEDMAN, L
[J]. NUCLEAR INSTRUMENTS & METHODS, 1980, 170 (1-3): : 309 - 315
[10] LOW-NOISE, HIGH-VOLTAGE SECONDARY-EMISSION ION DETECTOR FOR POLYATOMIC IONS
BEUHLER, RJ
FRIEDMAN, L
[J]. INTERNATIONAL JOURNAL OF MASS SPECTROMETRY, 1977, 23 (02) : 81 - 97

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