A HALL 4-POINT PROBE ON THIN PLATES - THEORY AND EXPERIMENT

被引：12

作者：

BUEHLER, MG

机构：

来源：

关键词：

D O I：

10.1016/0038-1101(67)90163-3

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：801 / &

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[4]

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