THE INTERPRETATION OF RADIATION-DAMAGE MEASUREMENTS WITH ELECTRON-DIFFRACTION OF ORGANIC MATERIALS AT VERY LOW-TEMPERATURES

被引：11

作者：

KNAPEK, E

FORMANEK, H

LEFRANC, G

DIETRICH, I

机构：

来源：

ULTRAMICROSCOPY | 1984年 / 14卷 / 03期

关键词：

D O I：

10.1016/0304-3991(84)90093-7

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

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页码：253 / 263

页数：11

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