ADAPTION OF A LOW-TEMPERATURE X-RAY GUINIER DIFFRACTOMETER FOR USE FROM 12-K TO 700-K

被引：9

作者：

IHRINGER, J

APPEL, W

机构：

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1984年 / 55卷 / 12期

关键词：

D O I：

10.1063/1.1137690

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

收藏

页码：1978 / 1979

页数：2

相关论文

共 4 条

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JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1979, 12 (APR) :221-224

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[4] METHOD TO OBTAIN GOOD HIGH-TEMPERATURE X-RAY PATTERNS WITH A GUINIER-LENNE CAMERA [J].

SUSZ, C ;

YVON, K .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1973, 6 (AUG1) :295-297