HOT-CARRIER MICROWAVE DETECTOR

[1] CARRIER ACCUMULATION IN GERMANIUM [J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B, 1956, 69 (07): : 697 - 704

[2] AYER WE, 1956, ASTIAAD107669

[3] AYER WE, 1956, AF3360027784

[4] AYER WE, 1956, 1503 STANF EL LABS T

[5] BENNET WR, 1960, ELECTRICAL NOISE

[6] BOK J, 1960, SOLID STATE PHYSIC 1, V1, P475

[7] SCATTERING OF HOT CARRIERS IN GERMANIUM [J]. JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1960, 15 (3-4) : 208 - 217

[8] Davis E.M., 1958, J ELECTRON CONTR, V4, P17

[9] DESIRANT M, 1960, SOLID STATE PHYSI ED, V1, P475

[10] MICROWAVE DETECTION AND MIXING USING THE THERMOELECTRIC EFFECT OF HOT CARRIERS IN SEMICONDUCTORS [J]. APPLIED PHYSICS LETTERS, 1963, 3 (09) : 153 - 154

[1] CARRIER ACCUMULATION IN GERMANIUM [J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B, 1956, 69 (07): : 697 - 704

[2] AYER WE, 1956, ASTIAAD107669

[3] AYER WE, 1956, AF3360027784

[4] AYER WE, 1956, 1503 STANF EL LABS T

[5] BENNET WR, 1960, ELECTRICAL NOISE

[6] BOK J, 1960, SOLID STATE PHYSIC 1, V1, P475

[7] SCATTERING OF HOT CARRIERS IN GERMANIUM [J]. JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1960, 15 (3-4) : 208 - 217

[8] Davis E.M., 1958, J ELECTRON CONTR, V4, P17

[9] DESIRANT M, 1960, SOLID STATE PHYSI ED, V1, P475

[10] MICROWAVE DETECTION AND MIXING USING THE THERMOELECTRIC EFFECT OF HOT CARRIERS IN SEMICONDUCTORS [J]. APPLIED PHYSICS LETTERS, 1963, 3 (09) : 153 - 154