PHOTOELECTROCHEMICAL AND SPECTROSCOPIC CHARACTERIZATION OF THIN-FILMS OF TITANYL PHTHALOCYANINE - COMPARISONS WITH VANADYL PHTHALOCYANINE

被引:93
作者
KLOFTA, TJ [1 ]
DANZIGER, J [1 ]
LEE, P [1 ]
PANKOW, J [1 ]
NEBESNY, KW [1 ]
ARMSTRONG, NR [1 ]
机构
[1] UNIV ARIZONA, DEPT CHEM, TUCSON, AZ 85721 USA
关键词
D O I
10.1021/j100306a030
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
引用
收藏
页码:5646 / 5651
页数:6
相关论文
共 35 条
[1]   VOLTAMMETRIC CHARACTERIZATION OF GOLD, METALLIZED-PLASTIC ELECTRODES, FOLLOWING EXPOSURE TO ION-BEAMS OR RF PLASMAS [J].
ARMSTRONG, NR ;
WHITE, JR .
JOURNAL OF ELECTROANALYTICAL CHEMISTRY, 1982, 131 (JAN) :121-136
[2]   CHEMISTRY OF DICHLORO[PHTHALOCYANINATO(2-)]TITANIUM(4) [J].
BLOCK, BP ;
MELONI, EG .
INORGANIC CHEMISTRY, 1965, 4 (01) :111-&
[3]  
BURRELL MC, APPL SURF SCI
[4]   PHOTOELECTROCHEMICAL RESPONSE OF GAPC-C1 THIN-FILM ELECTRODES USING 2 PHOTON SOURCES AND 2 ILLUMINATION DIRECTIONS [J].
BUTTNER, W ;
RIEKE, P ;
ARMSTRONG, NR .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1984, 131 (01) :226-228
[5]   THE AU/GAPC-CL/FERRI,FERROCYANIDE/GAPC-CL/PT PHOTOELECTROCHEMICAL CELL [J].
BUTTNER, WJ ;
RIEKE, PC ;
ARMSTRONG, NR .
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1985, 107 (12) :3738-3739
[6]   EVIDENCE FOR CHARGE TRAPPING AT THE GOLD CHLOROGALLIUM PHTHALOCYANINE INTERFACE USING PHOTOCURRENT SPECTROSCOPY WITH ONE OR 2 ILLUMINATION SOURCES [J].
BUTTNER, WJ ;
RIEKE, PC ;
ARMSTRONG, NR .
JOURNAL OF PHYSICAL CHEMISTRY, 1985, 89 (07) :1116-1121
[7]   ELECTRICAL, STRUCTURAL AND GAS SENSING PROPERTIES OF ZINC PHTHALOCYANINE THIN-FILMS [J].
COLLINS, RA ;
MOHAMMED, KA .
THIN SOLID FILMS, 1986, 145 (01) :133-145
[8]   PHTHALOCYANINE THIN-FILMS AS SEMICONDUCTOR ELECTRODES [J].
FAN, FR ;
FAULKNER, LR .
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1979, 101 (17) :4779-4787
[9]   PHOTO-VOLTAIC EFFECTS OF METAL-FREE AND ZINC PHTHALOCYANINES .2. PROPERTIES OF ILLUMINATED THIN-FILM CELLS [J].
FAN, FR ;
FAULKNER, LR .
JOURNAL OF CHEMICAL PHYSICS, 1978, 69 (07) :3341-3349
[10]  
Gerischer H., 1979, Solar energy conversion. Solid-state physics aspects, P115