AUGER-ELECTRON EMISSION UNDER ION-BEAM SHADOWING CONDITIONS

被引：6

作者：

KUDO, H

MURAKAMI, K

TAKITA, K

MASUDA, K

SEKI, S

SHIMA, K

ITOH, H

IPPOSHI, T

机构：

[1] UNIV TSUKUBA,INST MAT SCI,SAKURA,IBARAKI 305,JAPAN

[2] UNIV TSUKUBA,TANDEM ACCELERATOR CTR,SAKURA,IBARAKI 305,JAPAN

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1985年 / 24卷 / 11期

关键词：

D O I：

10.1143/JJAP.24.1440

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1440 / 1444

页数：5

共 11 条

[1]

FELDMAN LC, 1982, MATERIALS ANAL ION C, pCH1

[2] ENERGY-LOSS OF TRANSMITTED AND BACKSCATTERED ELECTRONS [J].

FITTING, HJ .

JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1975, 8 (13) :1480-1486

[3] LOW-ENERGY ELECTRON BEAM STUDIES IN THIN ALUMINUM FOILS [J].

GARBER, FW ;

NAKAI, MY ;

HARTER, JA ;

BIRKHOFF, RD .

JOURNAL OF APPLIED PHYSICS, 1971, 42 (03) :1149-&

[4]

Hansteen J. M., 1975, Atomic Data and Nuclear Data Tables, V15, P305, DOI 10.1016/0092-640X(75)90009-1

[5] ELECTRON STOPPING POWER IN ALUMINUM IN ENERGY REGION FROM 2 TO 10.9 KEV [J].

ISHIGURE, N ;

MORI, C ;

WATANABE, T .

JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1978, 44 (03) :973-978

[6] ENERGY-SPECTRA OF ION-INDUCED AUGER ELECTRONS UNDER CHANNELING CONDITIONS [J].

KUDO, H ;

SCHNEIDER, D ;

KANTER, EP ;

ARCUNI, PW ;

JOHNSON, EA .

PHYSICAL REVIEW B, 1984, 30 (09) :4899-4904

[7] CHANNELING EFFECT MEASUREMENTS IN SI BY USING RESONANT NUCLEAR BACKSCATTERING OF 18-19-MEV ALPHA-PARTICLES [J].

KUDO, H ;

TAKITA, K ;

MASUDA, K ;

SEKI, S .

JOURNAL OF APPLIED PHYSICS, 1981, 52 (06) :4322-4324

[8]

Seah M. P., 1979, Surface and Interface Analysis, V1, P2, DOI 10.1002/sia.740010103

[9] AN ANALYTICAL EXPRESSION FOR THE CALCULATION OF ELECTRON MEAN FREE PATHS IN SOLIDS [J].

SZAJMAN, J ;

LECKEY, RCG .

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1981, 23 (01) :83-96

[10] ELECTRON INELASTIC MEAN FREE PATHS AND ENERGY-LOSSES IN SOLIDS .2. ELECTRON-GAS STATISTICAL-MODEL [J].

TUNG, CJ ;

ASHLEY, JC ;

RITCHIE, RH .

SURFACE SCIENCE, 1979, 81 (02) :427-439

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