ELEMENTAL TRACE ANALYSIS OF SMALL SAMPLES BY PROTON-INDUCED X-RAY-EMISSION

被引:148
作者
JOHANSSON, TB
VANGRIEKEN, RE
NELSON, JW
WINCHESTER, JW
机构
[1] FLORIDA STATE UNIV,DEPT PHYS,TALLAHASSEE,FL 32306
[2] FLORIDA STATE UNIV,DEPT OCEANOG,TALLAHASSEE,FL 32306
关键词
D O I
10.1021/ac60356a035
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
引用
收藏
页码:855 / 860
页数:6
相关论文
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