NITRIDIZATION OF GALLIUM-ARSENIDE SURFACES - EFFECTS ON DIODE LEAKAGE CURRENTS

被引:24
作者
PEARTON, SJ
HALLER, EE
ELLIOT, AG
机构
[1] UNIV CALIF BERKELEY,BERKELEY,CA 94720
[2] HEWLETT PACKARD CO,DIV OPTOELECTR,PALO ALTO,CA 94304
关键词
D O I
10.1063/1.94877
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:684 / 686
页数:3
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