PRECISION X-RAY SPECTROSCOPY ON 8.5 MEV/AMU HEAVY-IONS

被引：9

作者：

DIETRICH, DD

CHANDLER, GA

FORTNER, RJ

HAILEY, CJ

STEWART, RE

机构：

[1] Lawrence Livermore Natl Lab,, Livermore, CA, USA, Lawrence Livermore Natl Lab, Livermore, CA, USA

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1985年 / 9卷 / 04期

关键词：

ION BEAMS - IONIZATION - IONS - SPECTROMETERS;

D O I：

10.1016/0168-583X(85)90393-3

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A new experimental capability has beend eveloped at the Lawrence Berkeley Laboratory Super-HILAC to investigate questions relating to high resolution atomic spectroscopy. A key element of these measurements is a dual arm Johann spectrometer. The ion beam passes inside the Rowland circle of two curved crystals which are mounted such that diffracted X-rays have equal na and opposite linear Doppler shifts. The X-ray lines are detected with high speed X-ray film mounted on the Rowland circle. The beam-crystal geometry is arranged so a spectral range of 30 degree -70 degree is detected. Typical results are presented.

引用

页码：686 / 688

页数：3

共 14 条

[1] THE ADVANCED POSITIVE HEAVY-ION SOURCES [J].