EFFECT OF MEASUREMENT GEOMETRY ON WEAK LOCALIZATION IN SHORT WIRES

被引：26

作者：

CHANDRASEKHAR, V ^{[1
]}

PROBER, DE ^{[1
]}

SANTHANAM, P ^{[1
]}

机构：

[1] IBM CORP,THOMAS J WATSON RES CTR,DIV RES,YORKTOWN HTS,NY 10598

来源：

PHYSICAL REVIEW LETTERS | 1988年 / 61卷 / 19期

关键词：

D O I：

10.1103/PhysRevLett.61.2253

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：2253 / 2256

页数：4

共 24 条

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