SCATTERING MATRIX APPROACH TO THERMAL WAVE-PROPAGATION IN LAYERED STRUCTURES

[1] THERMOOPTICAL SPECTROSCOPY - DETECTION BY THE MIRAGE EFFECT [J]. APPLIED PHYSICS LETTERS, 1980, 36 (02) : 130 - 132

[2] Brekhovskikh L. M., 1980, WAVES LAYERED MEDIA, P53

[3] OPTOACOUSTIC PHASE-ANGLE MEASUREMENT FOR PROBING A METAL [J]. APPLIED PHYSICS LETTERS, 1979, 35 (10) : 759 - 760

[4] OPTOACOUSTIC IMAGES [J]. JOURNAL OF APPLIED PHYSICS, 1980, 51 (07) : 3576 - 3578

[5] OPTOACOUSTIC AND PHOTOTHERMAL MATERIAL INSPECTION TECHNIQUES [J]. APPLIED OPTICS, 1982, 21 (01): : 107 - 110

[6] Carslaw H. S., 1959, CONDUCTION HEAT SOLI, P75

[7] SPATIAL-RESOLUTION OF THERMAL WAVE MICROSCOPES [J]. APPLIED PHYSICS LETTERS, 1983, 43 (05) : 446 - 448

[8] LUUKKALA M, 1980, SCANNED IMAGE MICROS, P273

[9] LUUKKALA M, 1979, ELECTRON LETT, V15, P326

[10] Martin Y., 1982, 1982 Ultrasonics Symposium Proceedings, P563

[1] THERMOOPTICAL SPECTROSCOPY - DETECTION BY THE MIRAGE EFFECT [J]. APPLIED PHYSICS LETTERS, 1980, 36 (02) : 130 - 132

[2] Brekhovskikh L. M., 1980, WAVES LAYERED MEDIA, P53

[3] OPTOACOUSTIC PHASE-ANGLE MEASUREMENT FOR PROBING A METAL [J]. APPLIED PHYSICS LETTERS, 1979, 35 (10) : 759 - 760

[4] OPTOACOUSTIC IMAGES [J]. JOURNAL OF APPLIED PHYSICS, 1980, 51 (07) : 3576 - 3578

[5] OPTOACOUSTIC AND PHOTOTHERMAL MATERIAL INSPECTION TECHNIQUES [J]. APPLIED OPTICS, 1982, 21 (01): : 107 - 110

[6] Carslaw H. S., 1959, CONDUCTION HEAT SOLI, P75

[7] SPATIAL-RESOLUTION OF THERMAL WAVE MICROSCOPES [J]. APPLIED PHYSICS LETTERS, 1983, 43 (05) : 446 - 448

[8] LUUKKALA M, 1980, SCANNED IMAGE MICROS, P273

[9] LUUKKALA M, 1979, ELECTRON LETT, V15, P326

[10] Martin Y., 1982, 1982 Ultrasonics Symposium Proceedings, P563