WIDTH DISTRIBUTION FOR RANDOM-WALK INTERFACES

被引:104
作者
FOLTIN, G
OERDING, K
RACZ, Z
WORKMAN, RL
ZIA, RKP
机构
[1] VIRGINIA POLYTECH INST & STATE UNIV, DEPT PHYS, BLACKSBURG, VA 24061 USA
[2] HEINRICH HEINE UNIV, INST THEORET PHYS, D-40225 DUSSELDORF, GERMANY
[3] EOTVOS LORAND UNIV, INST THEORET PHYS, H-1088 BUDAPEST, HUNGARY
关键词
D O I
10.1103/PhysRevE.50.R639
中图分类号
O35 [流体力学]; O53 [等离子体物理学];
学科分类号
070204 ; 080103 ; 080704 ;
摘要
Roughening of a one-dimensional interface is studied under the assumption that the interface configurations are continuous, periodic random walks. The distribution of the square of the width of interface, w2, is found to scale as P(w2)=[w2]-1PHI(w2/[w2]) where [w2] is the average of w2. We calculate the scaling function PHI(x) exactly and compare it both to exact enumerations for a discrete-slope surface evolution model and to PHI's obtained in Monte Carlo simulations of equilibrium and driven interfaces of chemically reacting systems.
引用
收藏
页码:R639 / R642
页数:4
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