STEP CONTRAST ON ULTRATHIN AU FILMS INVESTIGATED BY TEM

被引：6

作者：

KLAUA, M

BETHGE, H

机构：

来源：

ULTRAMICROSCOPY | 1985年 / 17卷 / 01期

关键词：

D O I：

10.1016/0304-3991(85)90179-2

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：73 / 79

页数：7

共 29 条

[1] DECORATION OF FACETS ON SILVER [J].

ALLPRESS, JG ;

SANDERS, JV .

PHILOSOPHICAL MAGAZINE, 1964, 9 (100) :645-&

[2] LEED INTENSITY ANALYSIS OF EPITAXIAL AG/AU SYSTEMS .2. LEED STUDY OF THE INITIAL-STAGES OF EPITAXY [J].

AMMER, C ;

KLAUA, M ;

BETHGE, H .

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1982, 71 (02) :415-428

[3]

ASSUNMAA S, 1964, T MET SOC AIME, V230, P1507

[4] A NEW TECHNIQUE FOR DECORATION OF CLEAVAGE AND SLIP STEPS ON IONIC CRYSTAL SURFACES [J].

BASSETT, GA .

PHILOSOPHICAL MAGAZINE, 1958, 3 (33) :1042-&

[5] THE RESOLUTION OF THE LOW-ENERGY ELECTRON REFLECTION MICROSCOPE [J].

BAUER, E .

ULTRAMICROSCOPY, 1985, 17 (01) :51-56

[6] OBERFLACHENSTRUKTUREN UND KRISTALLBAUFEHLER IM ELEKTRONENMIKROSKOPISCHEN BILD, UNTERSUCHT AM NACL(II) [J].

BETHGE, H .

PHYSICA STATUS SOLIDI, 1962, 2 (07) :775-820

[7]

BETHGE H, 1966, ANN PHYS-BERLIN, V17, P177

[8] SCANNING TUNNELING MICROSCOPY [J].

BINNIG, G ;

ROHRER, H .

SURFACE SCIENCE, 1983, 126 (1-3) :236-244

[9] DIRECT RESOLUTION OF SURFACE ATOMIC STEPS BY TRANSMISSION ELECTRON-MICROSCOPY [J].

CHERNS, D .

PHILOSOPHICAL MAGAZINE, 1974, 30 (03) :549-556

[10] RELATIVISTIC HARTREE-FOCK X-RAY AND ELECTRON SCATTERING FACTORS [J].

DOYLE, PA ;

TURNER, PS .

ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1968, A 24 :390-&

← 1 2 3 →