THE EFFECTS OF RAPID THERMAL ANNEALING ON THE PROPERTIES OF SPUTTERED YBCO SUPERCONDUCTING FILMS

被引：2

作者：

FLORENCE, RG ^{[1
]}

ANG, SS ^{[1
]}

BROWN, WD ^{[1
]}

机构：

[1] UNIV ARKANSAS,DEPT ELECT ENGN,FAYETTEVILLE,AR 72701

来源：

SUPERCONDUCTOR SCIENCE & TECHNOLOGY | 1994年 / 7卷 / 10期

关键词：

D O I：

10.1088/0953-2048/7/10/008

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The effects of rapid thermal annealing on the material and electrical properties of sputter deposited yttrium barium copper oxide (YBa2Cu3O7-x) superconducting films were investigated. Rapid thermal annealing increased the critical current density but decreased the critical transition temperature of the films. The maximum increase in critical current density, an order of magnitude, occurred at 800-degrees-C, while no increase was observed at 700-degrees-C, below the growth temperature of 735-degrees-C, or at 900-degrees-C. The increase in critical current density is due to a reduction in the density of misaligned grains as evidenced by a decreasing c-axis parameter and a decrease in the full width at half maximum (FWHM) Of the (005) peak. The critical temperature decreased for all annealing times and temperatures above the growth temperature due, presumably, to oxygen effusion from the films.

引用

页码：741 / 744

页数：4

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