MIL-STD-781C - A VICIOUS CIRCLE

被引：8

作者：

ASCHER, HE

机构：

来源：

IEEE TRANSACTIONS ON RELIABILITY | 1987年 / 36卷 / 04期

关键词：

D O I：

10.1109/TR.1987.5222422

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：397 / 402

页数：6

共 18 条

[1]

Ascher H, 1984, REPAIRABLE SYSTEMS R

[2]

ASCHER H, 1979 P ANN REL MAINT, P153

[3] AGE-DEPENDENT MINIMAL REPAIR [J].

BLOCK, HW ;

BORGES, WS ;

SAVITS, TH .

JOURNAL OF APPLIED PROBABILITY, 1985, 22 (02) :370-385

[4]

DUMMER GWA, 1986, MICROELECTRONICS REL, V26, P993

[5]

EASTERLING RG, 1985, TECHNOMETRICS, V27, P439

[6] EVALUATION OF EXPONENTIAL AND WEIBULL TEST PLANS [J].

HARTER, HL ;

MOORE, AH .

IEEE TRANSACTIONS ON RELIABILITY, 1976, 25 (02) :100-104

[7] SEQUENTIAL-TESTS OF HYPOTHESES FOR SYSTEM RELIABILITY MODELED BY A 2-PARAMETER WEIBULL DISTRIBUTION [J].

HARTER, HL ;

MOORE, AH ;

WIEGAND, RP .

IEEE TRANSACTIONS ON RELIABILITY, 1985, 34 (04) :352-355

[8]

MOGG JM, 1974, J QUALITY TECHNOLOGY, V6, P101

[9] ROBUSTNESS OF SEQUENTIAL EXPONENTIAL LIFE-TESTING PROCEDURES [J].

MONTAGNE, ER ;

SINGPURWALLA, ND .

JOURNAL OF THE AMERICAN STATISTICAL ASSOCIATION, 1985, 80 (391) :715-719

[10]

MONTAGNE ER, 1986, THEORY RELIABILITY, P169

← 1 2 →