MULTIPLE TRAPPING IN STRONG ELECTRIC-FIELDS

被引：16

作者：

ESIPOV, SE

机构：

[1] SYRACUSE UNIV,DEPT PHYS,SYRACUSE,NY 13244

[2] MOSCOW SOLID STATE PHYS INST,CHERNOGOVOVKA 142432,USSR

来源：

PHYSICAL REVIEW B | 1991年 / 44卷 / 15期

关键词：

D O I：

10.1103/PhysRevB.44.7930

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The time-dependent and steady-state drift mobilities of photoexcited carriers are calculated within a framework of a multiple-trapping model incorporating nonlinear effects due to a strong electric field. Tunneling processes from localized states to the transport edge and vice versa are taken into account. We discuss the application of the proposed theory to recent experiments and compare it with hopping theory.

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页码：7930 / 7934

页数：5

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