INFLUENCE OF THE OHMIC POLARIZATION EFFECT ON THIN-LAYER SPECTROELECTROCHEMISTRY

被引：5

作者：

CHEN, T ^{[1
]}

DONG, SJ ^{[1
]}

XIE, YW ^{[1
]}

机构：

[1] CHINESE ACAD SCI,CHANGCHUN INST APPL CHEM,ELECTROANALYT CHEM LAB,CHANGCHUN 130022,PEOPLES R CHINA

来源：

JOURNAL OF ELECTROANALYTICAL CHEMISTRY | 1994年 / 379卷 / 1-2期

关键词：

CYCLIC VOLTAMMETRY; THIN-LAYER RESISTANCE; THIN-LAYER SPECTROELECTROCHEMISTRY; OHMIC POLARIZATION EFFECT;

D O I：

10.1016/0022-0728(94)87144-2

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

The influence of thin-layer resistance in cyclic voltammetry was studied in detail. Under the experimental conditions, a linear relationship between the peak-peak potential difference and the product of the peak current and the resistance was obtained and can be used to determine the thin-layer solution resistance. A non-linear least-squares analysis was used to process the data and an empirical equation of the peak-peak potential difference (Delta E(p)) related to the ideal peak current (I-p(0)) and the thin-layer resistance (r(m)) was obtained as Delta E(p) = (5.931RT/F) ln(0.1400Ip(0)r(m)(F/RT) + 0.9819).

引用

页码：239 / 245

页数：7

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