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PROGRESS IN FERROELECTRIC MEMORY TECHNOLOGY
被引:49
作者
:
GEIDEMAN, WA
论文数:
0
引用数:
0
h-index:
0
机构:
McDonnell Douglas Electronic Systems Company, Santa Ana, CA 92705, 1801 E. St. Andrew Place
GEIDEMAN, WA
机构
:
[1]
McDonnell Douglas Electronic Systems Company, Santa Ana, CA 92705, 1801 E. St. Andrew Place
来源
:
IEEE TRANSACTIONS ON ULTRASONICS FERROELECTRICS AND FREQUENCY CONTROL
|
1991年
/ 38卷
/ 06期
关键词
:
4;
D O I
:
10.1109/58.108872
中图分类号
:
O42 [声学];
学科分类号
:
070206 ;
082403 ;
摘要
:
The application of ferroelectric films to semiconductor memories is described. Nonvolatile memory using the polarization hysteresis of ferroelectric is described. Test results for a PZT films on GaAs substrate are presented.
引用
收藏
页码:704 / 711
页数:8
相关论文
共 4 条
[1]
AN EXPERIMENTAL 512-BIT NONVOLATILE MEMORY WITH FERROELECTRIC STORAGE CELL
EVANS, JT
论文数:
0
引用数:
0
h-index:
0
机构:
KRYSALIS CORP,ALBUQUERQUE,NM 87109
KRYSALIS CORP,ALBUQUERQUE,NM 87109
EVANS, JT
WOMACK, R
论文数:
0
引用数:
0
h-index:
0
机构:
KRYSALIS CORP,ALBUQUERQUE,NM 87109
KRYSALIS CORP,ALBUQUERQUE,NM 87109
WOMACK, R
[J].
IEEE JOURNAL OF SOLID-STATE CIRCUITS,
1988,
23
(05)
: 1171
-
1175
[2]
SCHWEE LJ, COMMUNICATION
[3]
WU SY, 1974, IEEE T ELECTRON DEV, VED21, P499
[4]
1988, NONVOLATILE FERROELE
←
1
→
共 4 条
[1]
AN EXPERIMENTAL 512-BIT NONVOLATILE MEMORY WITH FERROELECTRIC STORAGE CELL
EVANS, JT
论文数:
0
引用数:
0
h-index:
0
机构:
KRYSALIS CORP,ALBUQUERQUE,NM 87109
KRYSALIS CORP,ALBUQUERQUE,NM 87109
EVANS, JT
WOMACK, R
论文数:
0
引用数:
0
h-index:
0
机构:
KRYSALIS CORP,ALBUQUERQUE,NM 87109
KRYSALIS CORP,ALBUQUERQUE,NM 87109
WOMACK, R
[J].
IEEE JOURNAL OF SOLID-STATE CIRCUITS,
1988,
23
(05)
: 1171
-
1175
[2]
SCHWEE LJ, COMMUNICATION
[3]
WU SY, 1974, IEEE T ELECTRON DEV, VED21, P499
[4]
1988, NONVOLATILE FERROELE
←
1
→