MEASUREMENTS OF DIAGNOSTIC-X-RAY BACKSCATTER BY A NOVEL ION-CHAMBER METHOD

被引：28

作者：

STANTON, L

BRATTELLI, SD

DAY, JL

STANTON, RE

VILLAFANA, T

机构：

[1] COOPER MED CTR,CAMDEN,NJ 08103

[2] TEMPLE UNIV,MED CTR,PHILADELPHIA,PA 19140

来源：

MEDICAL PHYSICS | 1982年 / 9卷 / 01期

关键词：

D O I：

10.1118/1.595140

中图分类号：

R8 [特种医学]; R445 [影像诊断学];

学科分类号：

1002 ; 100207 ; 1009 ;

摘要：

引用

页码：121 / 130

页数：10

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Hubbell J.H, 1969, NSRDSNBS29

[9] SURFACE BACK-SCATTER IN THE 100 KV TO 400 KV RANGE [J].

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[10]

JOHNS HLE, 1969, PHYSICS RADIOLOGY

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