HIGH-RESOLUTION STRUCTURE IMAGES AROUND THE POLE PATTERN OF A BENT CRYSTAL - APPLICATION - DEFORMATION OF A CRYSTAL NEAR A DEFECT

被引：5

作者：

CESARI, C

NIHOUL, G

YANGUI, B

BOULESTEIX, C

机构：

[1] UNIV TOULON,ERA 545,F-83130 LA GARDE,FRANCE

[2] FAC SCI ST JEROME,ERA 545,F-13397 MARSEILLE 13,FRANCE

[3] FAC SCI TUNIS BELVEDERE,DEPT PHYS,TUNIS,TUNISIA

来源：

JOURNAL OF MICROSCOPY-OXFORD | 1984年 / 135卷 / JUL期

关键词：

D O I：

10.1111/j.1365-2818.1984.tb04646.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：25 / 38

页数：14

共 11 条

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[6] THEORETICAL-STUDY OF HIGH-RESOLUTION ELECTRON-MICROSCOPY IMAGES OF MONOCLINIC RARE-EARTH-OXIDES, IE DYNAMIC OBJECTS WITH A THICKNESS UP TO 250-A [J].

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