POSSIBILITY OF DIRECT IMAGING OF POINT-DEFECTS IN CRYSTALS USING TRANSMISSION ELECTRON-MICROSCOPY

被引：15

作者：

KRAKOW, W

CHANG, ALJ

SASS, SL

机构：

[1] XEROX CORP,WEBSTER,NY 14580

[2] CORNELL UNIV,DEPT MAT SCI & ENGN,ITHACA,NY 14853

[3] CORNELL UNIV,CTR MAT SCI,ITHACA,NY 14853

来源：

PHILOSOPHICAL MAGAZINE | 1977年 / 35卷 / 03期

关键词：

D O I：

10.1080/14786437708235991

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：575 / 592

页数：18

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