CORE LEVEL PHOTOELECTRON MICROSCOPY

被引：29

作者：

PIANETTA, P

KING, PL

BORG, A

KIM, C

LINDAU, I

KNAPP, G

KEENLYSIDE, M

BROWNING, R

机构：

[1] SURFACE SCI INSTRUMENTS,MT VIEW,CA 94043

[2] STANFORD UNIV,CTR INTEGRATED SYST,STANFORD,CA 94305

来源：

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 1990年 / 52卷

关键词：

D O I：

10.1016/0368-2048(90)85065-H

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

Recent instrumental developments have extended the spatial resolution of photoelectron spectroscopy into the micron range. In this paper, one approach for high lateral resolution photoelectron microscopy which employs a superconducting magnet as a magnifying/projection lens is described along with recent results on photoemission (core level and valence band) and photoabsorption (near edge) spectroscopies. © 1990.

引用

页码：797 / 810

页数：14

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