IMPROVEMENT OF DEBYE-HUCKEL EVALUATION OF FREE CARRIER SCREENING EFFECTS IN SEMICONDUCTORS

被引：1

作者：

FARVACQUE, JL

机构：

来源：

PHYSICA STATUS SOLIDI B-BASIC RESEARCH | 1986年 / 134卷 / 01期

关键词：

D O I：

10.1002/pssb.2221340144

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

引用

页码：343 / 349

页数：7

共 12 条

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