DETECTION OF SMALL DIFFERENCES IN LATTICE-CONSTANT AT LOW-TEMPERATURE BY AN ENERGY-DISPERSIVE X-RAY DIFFRACTOMETER

被引：10

作者：

NAKAJIMA, T

FUKAMACHI, T

TERASAKI, O

HOSOYA, S

机构：

[1] TOHOKU UNIV,RES INST IRON STEEL & OTHER MET,SENDAI,JAPAN

[2] UNIV TOKYO,INST SOLID STATE PHYS,TOKYO,JAPAN

[3] TOHOKU UNIV,FAC SCI,DEPT PHYS,SENDAI,JAPAN

[4] UNIV TOKYO,INST SOLID STATE PHYS,TOKYO,JAPAN

来源：

关键词：

D O I：

10.1107/S0021889876011370

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：286 / 290

页数：5

共 10 条

[1] PRECISION OF INTERPLANAR DISTANCES MEASURED BY AN ENERGY-DISPERSIVE DIFFRACTOMETER
FUKAMACHI, T
HOSOYA, S
TERASAKI, O
[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1973, 6 (APR1): : 117 - 122
[2] HOARE FE, 1961, EXPT CRYOPHYSICS
[3] JOHANSSON B, 1976, J PHYS F, V5, pL15
[4] Kogan V. S., 1963, SOV PHYS USP, V5, P951
[5] London H., 1958, Z PHYS CHEM, V16, P302
[6] NAKAJIMA T, 1975, 14TH P INT C LOW TEM, V2, P81
[7] Sparks Jr C. J., 1972, ADV XRAY ANAL, V15, P240
[8] TAKASU S, 1970, J CRYST SOC JAPAN, V12, P162
[9] White G. K., 1968, EXPT TECHNIQUES LOW, V2
[10] NOTE ON ABERRATIONS OF A FIXED-ANGLE ENERGY-DISPERSIVE POWDER DIFFRACTOMETER
WILSON, AJC
[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1973, 6 (JUN1) : 230 - 237