PRECISION OF PIXE ANALYSIS OF THIN FLUID-RESIDUE SPECIMENS USING INTERNAL STANDARDS

被引：18

作者：

CAMPBELL, JL

TEESDALE, WJ

LEIGH, RG

机构：

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1985年 / 6卷 / 03期

关键词：

D O I：

10.1016/0168-583X(85)90017-5

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：551 / 557

页数：7

共 10 条

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