THE EFFECT OF SLIDER ROUGHNESS ON ASPERITY TESTING OF THIN-FILM MEDIA

被引:3
作者
CLARK, BK
机构
[1] Nashua Computer Products Corporation, Santa Clara, CA 95050
关键词
D O I
10.1109/20.195575
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Sliders used for glide (asperity) testing are typically comprised of Al2O3-TiC composites, with average grain sizes from under 1mum to 1.5mum. The air bearing surfaces are polished to an average roughness of less than 25 nm. Atomic force micro graphs (AFM) measured on sliders of different grain sizes, but polished by the same manufacturer, showed a wide variety of surface morphology. However, all slider surfaces had asperities which were 25 nm or higher and on the order of the Al2O3-TiC grain size in diameter. These asperities will result in a slider-disk spacing that is smaller than predicted from optical fly height measurement systems. Consequently, avalanche curves measured using calibrated asperities show initial contact occurring a micro-inch or more above where optical fly height measurements had predicted. With slider-disk spacing, for asperity testing, falling below 50 nm, slider asperities represent a substantial portion of the slider-disk spacing and must therefore, be factored into both testing and calibration.
引用
收藏
页码:235 / 240
页数:6
相关论文
共 5 条
[1]  
BHUSHAN B, J TRIBOLOGY, V111, P452
[2]  
BHUSHAN B, J TRIBOLOGY, V113, P452
[3]   AN EXPERIMENTAL CORRELATION OF SLIDER-DISK CONTACT DETECTION BETWEEN PIEZOELECTRIC AND ELECTRICAL-RESISTANCE MEASUREMENTS [J].
CLARK, BK .
IEEE TRANSACTIONS ON MAGNETICS, 1991, 27 (06) :5151-5153
[4]  
CLARK BK, 1991, IDEMAS DISKCON TECHN
[5]   NOVEL PIEZOELECTRIC TRANSDUCERS TO MONITOR HEAD-DISK INTERACTIONS [J].
YEACKSCRANTON, CE .
IEEE TRANSACTIONS ON MAGNETICS, 1986, 22 (05) :1011-1016