HIGH-RESOLUTION INTERFEROMETRIC-TECHNIQUE FOR IN-SITU STUDIES OF CRYSTAL-GROWTH MORPHOLOGIES AND KINETICS

被引:67
作者
VEKILOV, PG [1 ]
MONACO, LA [1 ]
ROSENBERGER, F [1 ]
机构
[1] UNIV ALABAMA,CTR MICROGRAV & MAT RES,HUNTSVILLE,AL 35899
基金
美国国家科学基金会; 美国国家航空航天局;
关键词
D O I
10.1016/0022-0248(94)00971-6
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
We have developed an interferometric technique for the high resolution monitoring of interfacial morphologies. Changes in feature height of 200 Angstrom over several days can be resolved across crystal facets several 100 mu m wide. This is achieved through signal processing based on the phase information contained in the interferometric intensity field and by applying corrections determined from an interferometric reference signal. Extensive tests on (110) faces of lysozyme crystals revealed growth rate fluctuations as a result of step bunching and other interfacial position-dependent step kinetics.
引用
收藏
页码:289 / 296
页数:8
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