AN INVESTIGATION OF DOPED POLYPYRROLE BY A COMBINATION OF SCANNING TUNNELING AND ATOMIC-FORCE MICROSCOPES

被引：7

作者：

DIETLER, G ^{[1
]}

HEUBERGER, M ^{[1
]}

TRESCH, S ^{[1
]}

BUJARD, P ^{[1
]}

机构：

[1] CIBA GEIGY CORP,CH-1723 MARLY,SWITZERLAND

来源：

SYNTHETIC METALS | 1994年 / 67卷 / 1-3期

关键词：

DOPING; POLYPYRROLE; MICROSCOPES;

D O I：

10.1016/0379-6779(94)90043-4

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

In this paper the results obtained by a combination of the scanning tunnelling microscope (STM) and of the atomic force microscope (AFM) on a polypyrrole sample doped by a sulfonated poly(beta-hydroxyether) matrix are presented. On the sample surface the existence of domains with very different conductivity is observed. These domains also exhibit a pressure-dependent conductivity which can be evidenced by curves of current versus distance and force versus distance recorded with the AFM/STM combination.

引用

页码：211 / 214

页数：4

共 5 条

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BINNIG, G
QUATE, CF
GERBER, C
[J]. PHYSICAL REVIEW LETTERS, 1986, 56 (09) : 930 - 933
[2] SURFACE STUDIES BY SCANNING TUNNELING MICROSCOPY
BINNING, G
ROHRER, H
GERBER, C
WEIBEL, E
[J]. PHYSICAL REVIEW LETTERS, 1982, 49 (01) : 57 - 61
[3] STABILITY OF TRANSVERSE BIPOLARONS IN CONDUCTING POLYMERS
BUSSAC, MN
ZUPPIROLI, L
[J]. PHYSICAL REVIEW B, 1994, 49 (09): : 5876 - 5880
[4] HEUBERGER M, 1994, THESIS U FRIBOURG SW
[5] YAMATO H, 1993, SYNTHETIC MET, V55, P3550

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