CHLORIDE-ION PENETRATION INTO OXIDE-FILMS ON ALUMINUM AUGER AND XPS STUDIES

被引：35

作者：

ATANASOSKA, LD

DRAZIC, DM

DESPIC, AR

ZALAR, A

机构：

[1] INST ELECTR & VACUUM TECH, LJUBLJANA, YUGOSLAVIA

[2] UNIV BELGRADE, FAC TECHNOL & MET, BELGRADE, YUGOSLAVIA

来源：

JOURNAL OF ELECTROANALYTICAL CHEMISTRY | 1985年 / 182卷 / 01期

关键词：

D O I：

10.1016/0368-1874(85)85451-4

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：179 / 186

页数：8

共 23 条

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