REMOTE-SENSING OF CROP PARAMETERS WITH A POLARIZED, FREQUENCY-DOUBLED ND-YAG LASER

被引：15

作者：

KALSHOVEN, JE ^{[1
]}

TIERNEY, MR ^{[1
]}

DAUGHTRY, CST ^{[1
]}

MCMURTREY, JE ^{[1
]}

机构：

[1] USDA ARS,REMOTE RES LAB,BELTSVILLE,MD 20705

来源：

APPLIED OPTICS | 1995年 / 34卷 / 15期

关键词：

LASER; LASER APPLICATIONS; REMOTE SENSING; POLARIZATION; MULTISPECTRAL; NORMALIZED DIFFERENCE VEGETATION INDEX; LEAF AREA INDEX; CROP YIELD; PLANT STRESS; AGRICULTURE; LIDAR;

D O I：

10.1364/AO.34.002745

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Polarized laser remote-sensing measurements that correlate the yield, the normalized difference vegetation index, and the leaf area index with the depolarized backscattered radiation from corn plots grown with eight different nitrogen fertilization dosages are presented. A polarized Nd:YAG laser emitting at 1064 and 532 nm is used. Depolarization increased significantly with increasing fertilization at the infrared wavelength, and there was a decrease in the depolarization at the green wavelength. The depolarization spectral difference index, defined as the absolute difference in the depolarization at the two wavelengths, is introduced as a parameter that is an indicator of the condition of the internal leaf structure.

引用

页码：2745 / 2749

页数：5

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