CAUSALITY-BASED FAILURE-DRIVEN LEARNING IN DIAGNOSTIC EXPERT SYSTEMS

被引：11

作者：

RICH, SH ^{[1
]}

VENKATASUBRAMANIAN, V ^{[1
]}

机构：

[1] COLUMBIA UNIV,DEPT CHEM ENGN,INTELLIGENT SYST PROC ENGN LAB,NEW YORK,NY 10027

来源：

AICHE JOURNAL | 1989年 / 35卷 / 06期

关键词：

D O I：

10.1002/aic.690350607

中图分类号：

TQ [化学工业];

学科分类号：

0817 ;

摘要：

引用

收藏

页码：943 / 950

页数：8

相关论文

共 10 条

[1] Himmelblau D.M., 1978, FAULT DETECTION DIAG
[2] Michalski R. S, 1983, MACHINE LEARNING
[3] GENERALIZATION AS SEARCH
MITCHELL, TM
[J]. ARTIFICIAL INTELLIGENCE, 1982, 18 (02) : 203 - 226
[4] MITCHELL TM, 1983, MACH LEARN, P163
[5] Pazzani M. J., 1986, Proceedings AAAI-86: Fifth National Conference on Artificial Intelligence, P1029
[6] USING EMPIRICAL-ANALYSIS TO REFINE EXPERT SYSTEM KNOWLEDGE BASES
POLITAKIS, P
WEISS, SM
[J]. ARTIFICIAL INTELLIGENCE, 1984, 22 (01) : 23 - 48
[7] A THEORY OF DIAGNOSIS FROM 1ST PRINCIPLES
REITER, R
[J]. ARTIFICIAL INTELLIGENCE, 1987, 32 (01) : 57 - 95
[8] MODEL-BASED REASONING IN DIAGNOSTIC EXPERT SYSTEMS FOR CHEMICAL PROCESS PLANTS
RICH, SH
VENKATASUBRAMANIAN, V
[J]. COMPUTERS & CHEMICAL ENGINEERING, 1987, 11 (02) : 111 - 122
[9] STEELS L, 1985, KNOWLEDGE BASED PROB, P270
[10] AN OBJECT-ORIENTED 2-TIER ARCHITECTURE FOR INTEGRATING COMPILED AND DEEP-LEVEL KNOWLEDGE FOR PROCESS DIAGNOSIS
VENKATASUBRAMANIAN, V
RICH, SH
[J]. COMPUTERS & CHEMICAL ENGINEERING, 1988, 12 (9-10) : 903 - 921