ESTIMATION OF A PLANAR MICROLENS BY OBLIQUE RAY TRACING

被引:6
作者
MISAWA, S [1 ]
IGA, K [1 ]
机构
[1] TOKYO INST TECHNOL, PRECIS MACHINERY & ELECTR RES LAB, MIDORI KU, YOKOHAMA, KANAGAWA 227, JAPAN
来源
APPLIED OPTICS | 1988年 / 27卷 / 03期
关键词
D O I
10.1364/AO.27.000480
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
引用
收藏
页码:480 / 485
页数:6
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