A MEASUREMENT OF SIGNAL-TO-NOISE RATIO VERSUS TRACKWIDTH FROM 128 -MU-M TO 4-MU-M

被引：5

作者：

JEFFERS, F

WACHENSCHWANZ, D

PHELPS, D

FREEMAN, J

机构：

[1] Eastman Kodak Co, San Diego, CA, USA, Eastman Kodak Co, San Diego, CA, USA

来源：

关键词：

D O I：

10.1109/TMAG.1987.1065755

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：2088 / 2090

页数：3

共 9 条

ABDULWAHAB, M .

[2] PARTICLE INTERACTION PHENOMENA [J].

BERTRAM, HN .

[3]

DANIEL E, 1960, AEL1 AMP RES RPT

[4]

HEMPSTEAD J, 1974, IBM J RES DEV, P547

Jeffers, Fred ;

Karsh, Herb .

[6]

MARUYAMA T, 1985, IECE TECH GRP P, V28, P17

[7]

SATAKE S, 1974, IECE TECHN GROUP M M, V23, P39

[8] STATISTICAL-ANALYSIS OF SIGNAL AND NOISE IN MAGNETIC RECORDING [J].

THURLINGS, L .

[9]

TSANG C, 1982, J APPL PHYS, V52, P2602