REFLECTOMETRY APPLIED TO DIFFUSE INTERFACES - POSSIBILITIES AND LIMITS OF THE TECHNIQUE

被引：15

作者：

SCHAAF, P

DEJARDIN, P

SCHMITT, A

机构：

来源：

REVUE DE PHYSIQUE APPLIQUEE | 1985年 / 20卷 / 09期

关键词：

D O I：

10.1051/rphysap:01985002009063100

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：631 / 640

页数：10

共 23 条

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