DETECTION OF HOT ELECTRON-INDUCED RADIATION-DAMAGE IN ORGANIC DIELECTRICS BY EXOELECTRON EMISSION FROM THIN-FILMS

被引：26

作者：

CARTIER, E

PFLUGER, P

机构：

来源：

IEEE TRANSACTIONS ON ELECTRICAL INSULATION | 1987年 / 22卷 / 02期

关键词：

D O I：

10.1109/TEI.1987.298868

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：123 / 128

页数：6

共 23 条

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PFLUGER, P
[J]. PHYSICAL REVIEW B, 1986, 34 (12): : 8822 - 8827
[6] Cram D., 1959, ORGANIC CHEM
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[8] ELECTRON HEATING IN SILICON DIOXIDE AND OFF-STOICHIOMETRIC SILICON DIOXIDE FILMS
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PESAVENTO, FL
DONG, DW
BRORSON, SD
[J]. JOURNAL OF APPLIED PHYSICS, 1985, 57 (04) : 1214 - 1238
[9] GLAEFEKE H, 1980, TOPICS APPLIED PHYSI, V37, P225
[10] HAGEMANN H, 1986, B AM PHYS SOC, V31, P51